872 search results - page 9 / 175 » UML-based design test generation |
VLSID
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
ICST
2009
IEEE
14 years 7 months ago
2009
IEEE
A software development process is conceptually an abstract form of model transformation, starting from an enduser model of requirements, through to a system model for which code c...
GLVLSI
2006
IEEE
15 years 3 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
DAC
1999
ACM
15 years 10 months ago
1999
ACM
112
Voted
IFIP
2001
Springer
15 years 1 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...