1776 search results - page 100 / 356 » Uncertain Linear Constraints |
ICIP
2003
IEEE
15 years 11 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
IJCNN
2006
IEEE
15 years 4 months ago
2006
IEEE
— Area Under the ROC Curve (AUC) is often used to evaluate ranking performance in binary classification problems. Several researchers have approached AUC optimization by approxi...
ISAAC
2003
Springer
15 years 3 months ago
2003
Springer
Abstract. We define an algorithm for determining, in a linear number of symbolic steps, the biconnected components of a graph implicitly represented with Ordered Binary Decision D...
SODA
1998
ACM
14 years 11 months ago
1998
ACM
We describe a new exact-arithmetic approach to linear programming when the number of variables n is much larger than the number of constraints m (or vice versa). The algorithm is ...
IJON
2008
14 years 10 months ago
2008
In this paper, an approach to solving the classical Traveling Salesman Problem (TSP) using a recurrent network of linear threshold (LT) neurons is proposed. It maps the classical ...