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TVLSI
2008
126views more  TVLSI 2008»
14 years 11 months ago
Body Bias Voltage Computations for Process and Temperature Compensation
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
SAB
2010
Springer
150views Optimization» more  SAB 2010»
14 years 9 months ago
Internal Models in the Cerebellum: A Coupling Scheme for Online and Offline Learning in Procedural Tasks
The cerebellum plays a major role in motor control. It is thought to mediate the acquisition of forward and inverse internal models of the bodyenvironment interaction [1]. In this ...
Jean-Baptiste Passot, Niceto Luque, Angelo Arleo
ISQED
2005
IEEE
120views Hardware» more  ISQED 2005»
15 years 5 months ago
Passive Hierarchical Model Order Reduction and Realization of RLCM Circuits
This paper presents a novel compact passive modeling technique for high-performance RF passives and interconnects modeled as high-order RLCM circuits. The new method is based on a...
Pu Liu, Zhenyu Qi, Sheldon X.-D. Tan
GECCO
2004
Springer
15 years 4 months ago
High Temperature Experiments for Circuit Self-Recovery
Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for ext...
Didier Keymeulen, Ricardo Salem Zebulum, Vu Duong,...
VLSID
2005
IEEE
224views VLSI» more  VLSID 2005»
15 years 11 months ago
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...