1217 search results - page 184 / 244 » Uncertainty-aware circuit optimization |
ASPDAC
2009
ACM
15 years 5 months ago
2009
ACM
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
DATE
2008
IEEE
15 years 5 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
ISQED
2005
IEEE
15 years 4 months ago
2005
IEEE
Abstract— Reliability enhancements are traditionally implemented through redundancies at the system level or through the use of harden-cell-designs at the circuit level. Reliabil...
SAMOS
2004
Springer
15 years 4 months ago
2004
Springer
A high-performance data-path to implement DSP kernels is proposed in this paper. The data-path is based on a flexible, universal, and regular component to optimally exploiting both...
GLVLSI
2010
IEEE
15 years 4 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...