1217 search results - page 193 / 244 » Uncertainty-aware circuit optimization |
HPCA
2005
IEEE
15 years 11 months ago
2005
IEEE
If current technology scaling trends hold, leakage power dissipation will soon become the dominant source of power consumption in high performance processors. Caches, due to the f...
ICCAD
2008
IEEE
15 years 8 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
ARITH
2009
IEEE
15 years 6 months ago
2009
IEEE
Moduli of the form 2n ± 1, which greatly simplify certain arithmetic operations in residue number systems (RNS), have been of longstanding interest. A steady stream of designs fo...
ISCAS
2008
IEEE
15 years 5 months ago
2008
IEEE
—In this paper a new ADC architecture of flash type is proposed. This proposed N-bit flash ADC replaces the (2N -1)-toN encoder with two (2N/2 -1)-to-(N/2) encoders to accomplish...
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ISQED
2008
IEEE
15 years 5 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...