1217 search results - page 223 / 244 » Uncertainty-aware circuit optimization |
DAC
2004
ACM
15 years 10 months ago
2004
ACM
Power consumption, particularly runtime leakage, in long on-chip buses has grown to an unacceptable portion of the total power budget due to heavy buffer insertion to combat RC de...
68
Voted
DAC
2005
ACM
15 years 10 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
57
Voted
DAC
2005
ACM
15 years 10 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
VLSID
2002
IEEE
15 years 9 months ago
2002
IEEE
The improved T and improved n models are proposed for onchip interconnect macromodeling. Using global approximations, simple approximation frames are derived and applied to modeli...
PERCOM
2006
ACM
15 years 9 months ago
2006
ACM
The European project COMSON (Coupled Multiscale Simulation and Optimization in Nanoelectronics) is a Marie Curie RTN project that involves five partners from academia and three fr...