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DATE
1998
IEEE
82views Hardware» more  DATE 1998»
15 years 3 months ago
Exploiting Symbolic Techniques for Partial Scan Flip Flop Selection
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATPG performance while keeping acceptable area and performance overheads. Several ...
Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda,...
DAC
1998
ACM
15 years 3 months ago
Adjoint Transient Sensitivity Computation in Piecewise Linear Simulation
This paper presents a general method for computing transient sensitivities using the adjoint method in event driven simulation algorithms that employ piecewise linear device model...
Tuyen V. Nguyen, Anirudh Devgan, Ognen J. Nastov
96
Voted
VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 3 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
ENGL
2008
79views more  ENGL 2008»
14 years 11 months ago
The Hamiltonicity of Crossed Cubes in the Presence of Faults
The crossed cube is considered as one of the most promising variations of the hypercube topology, due to its ability of preserving many of the attractive properties of the hypercub...
Emad Abuelrub
JC
2007
119views more  JC 2007»
14 years 11 months ago
Deterministic constructions of compressed sensing matrices
Compressed sensing is a new area of signal processing. Its goal is to minimize the number of samples that need to be taken from a signal for faithful reconstruction. The performan...
Ronald A. DeVore