As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
In this work, we propose an efficient and accurate full-chip thermomechanical stress and reliability analysis tool and design optimization methodology to alleviate mechanical rel...
Moongon Jung, Joydeep Mitra, David Z. Pan, Sung Ky...
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
Theorem proving techniques are particularly well suited for reasoning about arithmetic above the bit level and for relating di erent f abstraction. In this paper we show how a non-...
John W. O'Leary, Miriam Leeser, Jason Hickey, Mark...
In order to cope with the ever increasing complexity of todays application specific integrated circuits, a building block based design methodology is established. The system is co...