Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
In this paper we present two polynomial time-complexity heuristic algorithms for optimization of gate-oxide leakage (tunneling current) during behavioral synthesis through simulta...
Saraju P. Mohanty, Elias Kougianos, Ramakrishna Ve...
Contemporary microprocessors implement many iterative algorithms. For example, the front-end of a microprocessor repeatedly fetches and decodes instructions while updating interna...
Mark Aagaard, Robert B. Jones, Roope Kaivola, Kath...
VLSI (Very Large Scale Integration) CMOS (Complementary Metal Oxide Semiconductor) technology is the main driver of our digital revolution. The goals of these lecture are to learn ...
This paper describes the yield estimation approach to layout scaling of submicron VLSI circuits. The presented method makes it feasible to find scaling factor of the IC design whi...