In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
: This paper describes ASF, a novel cell-level analog synthesis framework that can size and bias a given circuit topology subject to a set of performance objectives and a manufactu...
Michael Krasnicki, Rodney Phelps, James R. Hellums...
We present a new approach for estimation and optimization of the average stand-by power dissipation in large MOS digital circuits. To overcome the complexity of state dependence i...
Supamas Sirichotiyakul, Tim Edwards, Chanhee Oh, J...
In this paper, we present a reduced order inodeling methodology, based on the utilization of optimal non-uniform grids generated by Gaussian spectral rules, for the direct passive...
Traianos Yioultsis, Anne Woo, Andreas C. Cangellar...
We present simulations for ultra-thin body, fully-depleted, double-gate (DG) silicon-on-insulator (SOI) devices that can be readily optimized for both static power loss and perfor...