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180
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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
86
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COMPSAC
2006
IEEE
15 years 6 months ago
2006
IEEE
Model-checking techniques are successfully used in the verification of both hardware and software systems of industrial relevance. Unfortunately, the capability of current techni...
128
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EMSOFT
2006
Springer
15 years 2 months ago
2006
Springer
Distributed real-time and embedded (DRE) systems have stringent constraints on timeliness and other properties whose assurance is crucial to correct system behavior. Formal tools ...
99
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CVGIP
2007
15 years 18 days ago
2007
This paper presents a technique for creating a smooth, closed surface from a set of 2D contours, which have been extracted from a 3D scan. The technique interprets the pixels that...
108
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KBSE
2010
IEEE
14 years 11 months ago
2010
IEEE
We study the problem of statistical model checking of probabilistic systems for PCTL unbounded until property P1p(ϕ1 U ϕ2) (where 1 ∈ {<, ≤, >, ≥}) using the computa...