932 search results - page 99 / 187 » Uniform Random Number Generators |
TCAD
2002
14 years 9 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
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ICDE
2011
IEEE
14 years 1 months ago
2011
IEEE
— In this paper, we study the problem of efficiently computing multiple aggregation queries over a data stream. In order to share computation, prior proposals have suggested ins...
ICCV
2005
IEEE
15 years 12 months ago
2005
IEEE
Visual codebook based quantization of robust appearance descriptors extracted from local image patches is an effective means of capturing image statistics for texture analysis and...
PERCOM
2006
ACM
15 years 9 months ago
2006
ACM
In mobile peer-to-peer (MP2P) networks, nodes tend to gather together rather than scattered uniformly across the network area. This paper considers the clustering of peer nodes an...
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...