1208 search results - page 62 / 242 » Uniform eventown problems |
ASPDAC
2006
ACM
15 years 4 months ago
2006
ACM
- Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/relia...
ATVA
2010
Springer
14 years 11 months ago
2010
Springer
In this paper we study the fault codiagnosis problem for discrete event systems given by finite automata (FA) and timed systems given by timed automata (TA). We provide a uniform c...
CVPR
2004
IEEE
16 years 7 days ago
2004
IEEE
We propose a variational algorithm to jointly estimate the shape, albedo, and light configuration of a Lambertian scene from a collection of images taken from different vantage po...
SODA
2010
ACM
15 years 7 months ago
2010
ACM
A monotone distribution P over a (partially) ordered domain assigns higher probability to y than to x if y x in the order. We study several natural problems concerning testing pr...
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ISSTA
2006
ACM
15 years 4 months ago
2006
ACM
Test campaigns usually require only a restricted subset of paths in a program to be thoroughly tested. As random testing (RT) offers interesting fault-detection capacities at low ...