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IDEAL
2005
Springer
15 years 3 months ago
Patterns in Complex Systems Modeling
The design, development, and use of complex systems models raises a unique class of challenges and potential pitfalls, many of which are commonly recurring problems. Over time, res...
Janet Wiles, James Watson
METRICS
2003
IEEE
15 years 3 months ago
Measuring and Improving Design Patterns Testability
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
Benoit Baudry, Yves Le Traon, Gerson Sunyé,...
ITC
2000
IEEE
101views Hardware» more  ITC 2000»
15 years 2 months ago
Reducing test data volume using external/LBIST hybrid test patterns
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
Debaleena Das, Nur A. Touba
FPL
2007
Springer
99views Hardware» more  FPL 2007»
15 years 1 months ago
Disjoint Pattern Enumeration for Custom Instructions Identification
Extensible processors allow addition of application-specific custom instructions to the core instruction set architecture. These custom instructions are selected through an analys...
Pan Yu, Tulika Mitra
SBACPAD
2008
IEEE
132views Hardware» more  SBACPAD 2008»
15 years 4 months ago
Aspect-Based Patterns for Grid Programming
The development of grid algorithms is frequently hampered by limited means to describe topologies and lack of support for the invasive composition of legacy components in order to...
Luis Daniel Benavides Navarro, Rémi Douence...