1266 search results - page 77 / 254 » Usability-Supporting Architectural Patterns |
VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
ICSE
2010
IEEE-ACM
15 years 2 months ago
2010
IEEE-ACM
Design pattern detection is a reverse engineering methodology that helps software engineers to analyze and understand legacy software by recovering its design and thereby aiding i...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
VLSID
2008
IEEE
15 years 10 months ago
2008
IEEE
In the automatic design of custom instruction set processors, there can be a very large set of potential custom instructions, from which a few instructions are required to be chos...
VLSID
2005
IEEE
15 years 3 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...