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ICCAD
1995
IEEE
167views Hardware» more  ICCAD 1995»
15 years 7 months ago
A novel methodology for statistical parameter extraction
IC manufacturing process variations are typically expressed in terms of joint probability density functions (jpdf’s) or as worst case combinations/corners of the device model pa...
Kannan Krishna, Stephen W. Director
116
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VISUALIZATION
1997
IEEE
15 years 7 months ago
Visualization of height field data with physical models and texture photomapping
This paper discusses a unique way to visualize height field data – the use of solid fabricated parts with a photomapped texture to display scalar information. In this process, t...
Dru Clark, Michael J. Bailey
142
Voted
ECOOPW
1997
Springer
15 years 7 months ago
The Object Model for a Product Based Development Process
The traditional workflow process model is typically illustrated with a graph of activities, tasks, deliverables and techniques. From an object-oriented perspective, every identifi...
Pavel Hruby
IFIP
1997
Springer
15 years 7 months ago
Waiting time distributions in a two-queue model with mixed exhaustive and gated-type K-limited services
We deal with a two-queue model with mixed exhaustive and gated-type K-limited services. This model can achieve various degrees of priority in each queue by varying the value of K....
Toshihisa Ozawa
151
Voted
LOGCOM
2008
103views more  LOGCOM 2008»
15 years 3 months ago
Computable Models
We investigate mathematical modelling with theories of data types. We provide a formal setting for the formulation of such theories (TPL) and use it to introduce the notion of a c...
Raymond Turner