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ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
15 years 3 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
IFIP12
2009
15 years 3 months ago
An Expert System Based on Parametric Net to Support Motor Pump Multi-Failure Diagnostic
Abstract Early failure detection in motor pumps is an important issue in prediction maintenance. An efficient condition-monitoring scheme is capable of providing warning and predic...
Flavia Cristina Bernardini, Ana Cristina Bicharra ...
BMCBI
2010
201views more  BMCBI 2010»
15 years 2 months ago
IntelliGO: a new vector-based semantic similarity measure including annotation origin
Background: The Gene Ontology (GO) is a well known controlled vocabulary describing the biological process, molecular function and cellular component aspects of gene annotation. I...
Sidahmed Benabderrahmane, Malika Smaïl-Tabbon...
MICRO
2010
IEEE
202views Hardware» more  MICRO 2010»
15 years 5 days ago
Hardware Support for Relaxed Concurrency Control in Transactional Memory
Today's transactional memory systems implement the two-phase-locking (2PL) algorithm which aborts transactions every time a conflict happens. 2PL is a simple algorithm that pr...
Utku Aydonat, Tarek S. Abdelrahman
TSE
2010
197views more  TSE 2010»
15 years 3 days ago
A Genetic Algorithm-Based Stress Test Requirements Generator Tool and Its Empirical Evaluation
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
Vahid Garousi
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