In this paper the problem of matching freeform surface features against measured point data is studied. The motivation for this investigation is the recent demand for fast and rob...
Joris S. M. Vergeest, Sander Spanjaard, Jos J. O. ...
Optimizing a semiconductor wafer fab requires balancing technology and productivity. Recent work on productivity modeling will be described and focus on discrete event simulation ...
GTE Laboratories, in cooperation with GTE Mobilnet, has developed and deployed PERFFEX (PERFormance Expert), an intelligent system for performance and configuration management of ...
Ming Tan, Carol Lafond, Gabriel Jakobson, Gary You...
Two approaches for integrating images into the framework of a database management system are presented. The classi cation approach preprocesses all images and attaches a semantic ...
Programming assignments are easy to plagiarize in such a way as to foil casual reading by graders. Graders can resort to automatic plagiarism detection systems, which can generate...