Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Abstract. Emerging pervasive computing technologies present many opportunities to aid ad-hoc collocated group collaboration. To better understand ad-hoc collaboration using pervasi...
Trevor Pering, Roy Want, Barbara Rosario, Shivani ...
Leakage power is one of the most critical issues for ultra-deep submicron technology. Subthreshold leakage depends exponentially on linewidth, and consequently variation in linewi...
ive. This characterization leads to model-based abstractions and representation design techniques as potential solutions. Many of the existing approaches to coping with data overlo...
David D. Woods, Emily S. Patterson, Emilie M. Roth
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...