1227 search results - page 53 / 246 » Using Generation for Grammar Analysis and Error Detection |
IOLTS
2007
IEEE
15 years 4 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
PR
2010
14 years 8 months ago
2010
Wavelet analysis has found widespread use in signal processing and many classification tasks. Nevertheless, its use in dynamic pattern recognition have been much more restricted ...
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DSN
2009
IEEE
15 years 4 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
ACSAC
2004
IEEE
15 years 1 months ago
2004
IEEE
Buffer overflow vulnerabilities are caused by programming errors that allow an attacker to cause the program to write beyond the bounds of an allocated memory block to corrupt oth...
GLVLSI
2009
IEEE
15 years 1 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...