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CODES
2008
IEEE
15 years 4 months ago
2008
IEEE
The heterogeneity of modern MPSoC architectures, coupled with the increasing complexity of the applications mapped onto them has recently led to a lot of interest in hybrid perfor...
UIST
2006
ACM
15 years 3 months ago
2006
ACM
NP-hard combinatorial optimization problems are common in real life. Due to their intractability, local search algorithms are often used to solve such problems. Since these algori...
DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
AOSD
2009
ACM
15 years 4 months ago
2009
ACM
e is an aspect-oriented hardware verification language that is widely used to verify the design of electronic circuits through the development and execution of testbenches. In rec...
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HPCA
2006
IEEE
15 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...