A new hardware developmental model that shows strong robust transient fault-tolerant abilities and is motivated by embryonic development and a honeycomb structure is presented. Ca...
Shor has showed how to perform fault tolerant quantum computation when the probability for an error in a qubit or a gate, η, decays with the size of the computation polylogarithmi...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...