612 search results - page 74 / 123 » Using Static Analysis to Improve Automatic Test Generation |
DATE
2006
IEEE
15 years 5 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
102
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CORR
2010
Springer
14 years 12 months ago
2010
Springer
As one of the newest members in the field of artificial immune systems (AIS), the Dendritic Cell Algorithm (DCA) is based on behavioural models of natural dendritic cells (DCs). U...
ICPR
2008
IEEE
15 years 6 months ago
2008
IEEE
This paper presents an improved version of our specific methodology to detect the vessel tree in retinal angiographies. The automatic analysis of retinal vessel tree facilitates ...
118
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RE
2008
Springer
14 years 11 months ago
2008
Springer
Early phases of software development are known to be problematic, difficult to manage and errors occurring during these phases are expensive to correct. Many systems have been deve...
108
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ICCAD
1995
IEEE
15 years 3 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...