612 search results - page 75 / 123 » Using Static Analysis to Improve Automatic Test Generation |
AVSS
2005
IEEE
15 years 5 months ago
2005
IEEE
In this paper, we present a video encoding scheme that uses object-based adaptation to deliver surveillance video to mobile devices. The method relies on a set of complementary vi...
107
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MM
2004
ACM
15 years 5 months ago
2004
ACM
Image annotations allow users to access a large image database with textual queries. There have been several studies on automatic image annotation utilizing machine learning techn...
DAC
2007
ACM
16 years 25 days ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
142
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PLDI
2011
ACM
14 years 2 months ago
2011
ACM
Compilers should be correct. To improve the quality of C compilers, we created Csmith, a randomized test-case generation tool, and spent three years using it to find compiler bug...
ISLPED
1997
ACM
15 years 4 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...