Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
Abstract-- Digital designs can be mapped to different implementations using diverse approaches, with varying cost criteria. Post-processing transforms, such as transistor sizing ca...
— Legacy systems that do not conform to the norms and regulations imposed by recent safety standards have to be upgraded to meet safety requirements. In this paper, we describe a...