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» Using Tweaks to Design Fault Resistant Ciphers
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DFT
2000
IEEE
105views VLSI» more  DFT 2000»
15 years 2 months ago
Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
Ching-Hwa Cheng, Jinn-Shyan Wang, Shih-Chieh Chang...
DATE
2009
IEEE
93views Hardware» more  DATE 2009»
15 years 4 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
EUROCRYPT
2003
Springer
15 years 2 months ago
A Theoretical Treatment of Related-Key Attacks: RKA-PRPs, RKA-PRFs, and Applications
ded abstract of this paper appears in Advances in Cryptology – EUROCRYPT ’03, Lecture Notes in Computer Science Vol. 2656, E. Biham ed., Springer-Verlag, 2003. This is the full...
Mihir Bellare, Tadayoshi Kohno
ITC
1994
IEEE
151views Hardware» more  ITC 1994»
15 years 1 months ago
Automated Logic Synthesis of Random-Pattern-Testable Circuits
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
Nur A. Touba, Edward J. McCluskey
GECCO
2003
Springer
128views Optimization» more  GECCO 2003»
15 years 2 months ago
Cellular Programming and Symmetric Key Cryptography Systems
Abstract. The problem of designing symmetric key cryptography algorithms based upon cellular automata (CAs) is considered. The reliability of the Vernam cipher used in the process ...
Franciszek Seredynski, Pascal Bouvry, Albert Y. Zo...