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DATE
2009
IEEE
106views Hardware» more  DATE 2009»
16 years 22 days ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
AVSS
2009
IEEE
15 years 9 months ago
Bayesian Bio-inspired Model for Learning Interactive Trajectories
—Automatic understanding of human behavior is an important and challenging objective in several surveillance applications. One of the main problems of this task consists in accur...
Alessio Dore, Carlo S. Regazzoni
ICDAR
2009
IEEE
16 years 22 days ago
Feature Based Binarization of Document Images Degraded by Uneven Light Condition
This paper proposes a document image binarization method, which is especially robust to the images degraded by uneven light condition, such as the camera captured document images....
Jung Gap Kuk, Nam Ik Cho
KBSE
2006
IEEE
16 years 10 min ago
Integrating and Scheduling an Open Set of Static Analyses
To improve the productivity of the development process, more and more tools for static software analysis are tightly integrated into the incremental build process of an IDE. If mu...
Michael Eichberg, Mira Mezini, Sven Kloppenburg, K...
BMCBI
2004
90views more  BMCBI 2004»
15 years 5 months ago
Statistical monitoring of weak spots for improvement of normalization and ratio estimates in microarrays
Background: Several aspects of microarray data analysis are dependent on identification of genes expressed at or near the limits of detection. For example, regression-based normal...
Igor Dozmorov, Nicholas Knowlton, Yuhong Tang, Mic...