We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signicantly aect the actual...
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...
In order to extract a suitable common core information model, design representations on both system and architecture levels are analyzed. Following the specification trajectory, ...
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
Hardware description languages (HDLs) are used today to describe circuits at all levels. In large HDL programs, there is a need for source code reduction techniques to address a my...
Edmund M. Clarke, Masahiro Fujita, Sreeranga P. Ra...