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EURODAC
1995
IEEE
126views VHDL» more  EURODAC 1995»
15 years 1 months ago
Quality considerations in delay fault testing
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...
Alicja Pierzynska, Slawomir Pilarski
EURODAC
1995
IEEE
100views VHDL» more  EURODAC 1995»
15 years 1 months ago
A unified approach to the extraction of realistic multiple bridging and break faults
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...
Gerald Spiegel, Albrecht P. Stroele
EURODAC
1995
IEEE
152views VHDL» more  EURODAC 1995»
15 years 1 months ago
Information model of a compound graph representation for system and architecture level design
In order to extract a suitable common core information model, design representations on both system and architecture levels are analyzed. Following the specification trajectory, ...
Peter Conradi
EURODAC
1995
IEEE
198views VHDL» more  EURODAC 1995»
15 years 1 months ago
On generating compact test sequences for synchronous sequential circuits
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
Irith Pomeranz, Sudhakar M. Reddy
97
Voted
CHARME
1999
Springer
130views Hardware» more  CHARME 1999»
15 years 1 months ago
Program Slicing of Hardware Description Languages
Hardware description languages (HDLs) are used today to describe circuits at all levels. In large HDL programs, there is a need for source code reduction techniques to address a my...
Edmund M. Clarke, Masahiro Fujita, Sreeranga P. Ra...