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EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
15 years 1 months ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
EURODAC
1994
IEEE
118views VHDL» more  EURODAC 1994»
15 years 1 months ago
A new knowledge-based design manager assistant for CAD frameworks
In this paper we introduce a new knowledgebased method for planning and managing the VLSI design process, based on prediction and advice, that minimizes search in a wide design sp...
Félix Moreno, Juan M. Meneses
EURODAC
1994
IEEE
110views VHDL» more  EURODAC 1994»
15 years 1 months ago
Symbolic exploration of large circuits with enhanced forward/backward traversals
Symbolic state space exploration techniques for Finite State Machines (FSMs) are a major recent result in CAD for VLSI. Most of them are exact and based on forward traversal, but ...
Gianpiero Cabodi, Paolo Camurati, Stefano Quer
EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
15 years 1 months ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...
ENC
2004
IEEE
15 years 1 months ago
On the Hardware Design of an Elliptic Curve Cryptosystem
We present a hardware architecture for an Elliptic Curve Cryptography System performing the three basic cryptographic schemes: DH key generation, encryption and digital signature....
Miguel Morales-Sandoval, Claudia Feregrino Uribe