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VLSID
2006
IEEE
94views VLSI» more  VLSID 2006»
15 years 10 months ago
On the Size and Generation of Minimal N-Detection Tests
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
Kalyana R. Kantipudi
GLVLSI
2005
IEEE
104views VLSI» more  GLVLSI 2005»
15 years 9 months ago
Wave-pipelined 2-slot time division multiplexed (WP/2-TDM) routing
The ever-increasing number of transistors on a chip has resulted in very large scale integration (VLSI) systems whose performance and manufacturing costs are driven by on-chip wir...
Ajay Joshi, Jeffrey A. Davis
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DFT
2003
IEEE
151views VLSI» more  DFT 2003»
15 years 9 months ago
Soft-Error Detection Using Control Flow Assertions
Over the last years, an increasing number of safety-critical tasks have been demanded to computer systems. In this paper, a software-based approach for developing safety-critical
O. Goloubeva, Maurizio Rebaudengo, Matteo Sonza Re...
DFT
2003
IEEE
81views VLSI» more  DFT 2003»
15 years 9 months ago
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
GLVLSI
2003
IEEE
135views VLSI» more  GLVLSI 2003»
15 years 9 months ago
Constructing exact octagonal steiner minimal trees
Octagonal Steiner Minimal Trees (OSMTs) are used in the global routing phase of pervasive octagonal VLSI layout. The OSMT problem seeks a minimal length spanning structure using e...
Chris Coulston