2449 search results - page 179 / 490 » VLSI |
123
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VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
Dynamic noise analysis is greatly needed in place of traditional static noise analysis due to the ever increasingly stringent design requirement for VLSI chips based on very deep ...
124
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VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
We consider the problem of minimizing the delay in signal transmission over point-to-point connections across multiple metal layers in a VLSI circuit. We present an exact solution...
137
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VLSID
2002
IEEE
16 years 4 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
106
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ICCD
2001
IEEE
16 years 1 months ago
2001
IEEE
Reduced Ordered Binary Decision Diagrams (BDDs) are a data structure for representation and manipulation of Boolean functions which are frequently used in VLSI Design Automation. ...
125
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ICCAD
2003
IEEE
16 years 1 months ago
2003
IEEE
As the size and complexity of VLSI circuits increase, the need for faster floorplanning algorithms also grows. In this work we introduce Traffic, a new method for creating wire- a...