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ICCAD
2001
IEEE
108views Hardware» more  ICCAD 2001»
16 years 1 months ago
Multigrid-Like Technique for Power Grid Analysis
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
Joseph N. Kozhaya, Sani R. Nassif, Farid N. Najm
DSD
2009
IEEE
111views Hardware» more  DSD 2009»
15 years 11 months ago
Robustness Check for Multiple Faults Using Formal Techniques
Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft error...
Stefan Frehse, Görschwin Fey, André S&...
GLVLSI
2009
IEEE
159views VLSI» more  GLVLSI 2009»
15 years 11 months ago
On the complexity of graph cuboidal dual problems for 3-D floorplanning of integrated circuit design
This paper discusses the impact of migrating from 2-D to 3-D on floorplanning and placement. By looking at a basic formulation of graph cuboidal dual problem, we show that the 3-...
Renshen Wang, Chung-Kuan Cheng
GLVLSI
2009
IEEE
112views VLSI» more  GLVLSI 2009»
15 years 11 months ago
Simultaneous shield and repeater insertion
Resource based optimization for high performance integrated circuits is presented. The methodology is applied to simultaneous shield and repeater insertion, resulting in minimum c...
Renatas Jakushokas, Eby G. Friedman
GLVLSI
2009
IEEE
125views VLSI» more  GLVLSI 2009»
15 years 11 months ago
Redundant wire insertion for yield improvement
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...
Jin-Tai Yan, Zhi-Wei Chen