— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft error...
This paper discusses the impact of migrating from 2-D to 3-D on floorplanning and placement. By looking at a basic formulation of graph cuboidal dual problem, we show that the 3-...
Resource based optimization for high performance integrated circuits is presented. The methodology is applied to simultaneous shield and repeater insertion, resulting in minimum c...
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...