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GLVLSI
2003
IEEE
161views VLSI» more  GLVLSI 2003»
15 years 9 months ago
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann
GLVLSI
2003
IEEE
134views VLSI» more  GLVLSI 2003»
15 years 9 months ago
Information storage capacity of crossbar switching networks
In this work we ask the fundamental question: How many bits of information can be stored in a crossbar switching network? The answer is trivial when the switches of the network ar...
Paul-Peter Sotiriadis
GLVLSI
2010
IEEE
119views VLSI» more  GLVLSI 2010»
15 years 9 months ago
Line width optimization for interdigitated power/ground networks
Higher operating frequencies have increased the importance of inductance in power and ground networks. The effective inductance of the power and ground network can be reduced with...
Renatas Jakushokas, Eby G. Friedman
DFT
2002
IEEE
121views VLSI» more  DFT 2002»
15 years 9 months ago
Testing Digital Circuits with Constraints
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McC...
DFT
2002
IEEE
128views VLSI» more  DFT 2002»
15 years 9 months ago
Matrix-Based Test Vector Decompression Using an Embedded Processor
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
Kedarnath J. Balakrishnan, Nur A. Touba