The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using...
Suriyaprakash Natarajan, Melvin A. Breuer, Sandeep...
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
Custom Computing Machines (CCM's) have demonstrated significant performance advantages over general-purpose processors for certain classes of problems. However, problems can ...
ended abstract defines a class of architectures for pipeline reconfigurable FPGAs by parameterizing a generic model. This class of architectures is sufficiently general to allow e...
In 1996, about 600 million IC-cards were manufactured worldwide. Due to very small die sizes (max. 25 mm2 ) smartcards encounter more severe restrictions than conventional coproces...