2449 search results - page 208 / 490 » VLSI |
134
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DFT
2004
IEEE
15 years 8 months ago
2004
IEEE
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
142
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DFT
2004
IEEE
15 years 8 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
137
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FCCM
2004
IEEE
15 years 8 months ago
2004
IEEE
This paper presents a method that offers a uniform treatment for bit-width optimisation of both fixed-point and floating-point designs. Our work utilises automatic differentiation...
166
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FCCM
2004
IEEE
15 years 8 months ago
2004
IEEE
It is valuable to identify and catalog design patterns for reconfigurable computing. These design patterns are canonical solutions to common and recurring design challenges which ...
155
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FCCM
2004
IEEE
15 years 8 months ago
2004
IEEE
In this paper, we introduce a novel architecture for a hardware based network intrusion detection system (NIDS). Current software-based NIDS are too compute intensive and can not ...