2449 search results - page 216 / 490 » VLSI |
VLSID
2005
IEEE
16 years 4 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
122
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VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
With shrinking noise margins and increasing numbers of on-chip noise sources, power grid design has become a critical performance determinant. This paper presents an overview of r...
131
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VLSID
2002
IEEE
16 years 4 months ago
2002
IEEE
Our target is automation of analog circuit's layout, which is a bottleneck in mixed-signal's design. We formulate the layout explicitly considering manufacturing process...
118
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FCCM
2008
IEEE
15 years 11 months ago
2008
IEEE
We present an AES cipher implementation that is based on the BlockRAM and DSP units embedded within Xilinx’s Virtex-5 FPGAs. An iterative “basic” module outputs a 32 bit col...
135
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ISVLSI
2007
IEEE
15 years 10 months ago
2007
IEEE
— Y -interconnects for VLSI chips are based on the use of global and semi-global wiring in only 0◦ , 60◦ , and 120◦ . Though X-interconnects are fast replacing the traditio...