2449 search results - page 219 / 490 » VLSI |
123
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VTS
2002
IEEE
15 years 9 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
125
Voted
VTS
2002
IEEE
15 years 9 months ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
144
Voted
VLSID
1998
IEEE
15 years 8 months ago
1998
IEEE
With several commercial tools becoming available, the high-level synthesis of applicationspeci c integrated circuits is nding wide spread acceptance in VLSI industry today. Existi...
140
Voted
ARVLSI
2001
IEEE
15 years 8 months ago
2001
IEEE
Control of adaptive optical elements for real-time wavefront phase distortion compensation is a rapidly growing field of research and technology development. Wavefront correction ...
100
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NIPS
2003
15 years 5 months ago
2003
We describe a procedure which finds a hierarchical clustering by hillclimbing. The cost function we use is a hierarchical extension of the -means cost; our local moves are tree...