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VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
Power consumption has become a major design limiter. With the continued reduction of threshold voltages, optimizing leakage energy consumption is becoming increasingly important. ...
136
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VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
: The accumulation of popular features in portable products such as mobile handsets is driving battery life to unacceptably low levels. Substantial change will not come from increm...
143
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VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
151
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VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
This paper targets at reducing the crosstalk noise closure time by filtering the set of false violations. We propose two approaches to reduce the pessimism in the crosstalk noise ...
143
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VLSID
2003
IEEE
16 years 6 months ago
2003
IEEE
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer ...