2449 search results - page 273 / 490 » VLSI |
149
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VLSID
2008
IEEE
16 years 16 days ago
2008
IEEE
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
151
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DFT
2007
IEEE
16 years 15 days ago
2007
IEEE
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...
147
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DFT
2007
IEEE
16 years 15 days ago
2007
IEEE
Chemically Assembled Electronic Nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing di...
163
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FCCM
2007
IEEE
16 years 15 days ago
2007
IEEE
This paper presents a code compression and on-thefly decompression scheme suitable for coarse-grain reconfigurable technologies. A novel unit-grouping dictionary based compression...
185
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FCCM
2007
IEEE
16 years 15 days ago
2007
IEEE
This paper presents the porting of an RTOS Micro C/OS-II on a novel reconfigurable instruction cell based architecture which fills the gap between DSP, FPGA and ASIC with high per...