2449 search results - page 296 / 490 » VLSI |
161
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VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
158
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VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
133
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VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
174
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VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
The Discrete Wavelet Transform (DWT) forms the core of the JPEG2000 image compression algorithm. Since the JPEG2000 compression application is heavily data-intensive, the overall ...
150
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VLSID
2006
IEEE
16 years 6 months ago
2006
IEEE
In the multi-GHz frequency domain, inductive and capacitive parasitics of interconnects can cause significant 'ringing' or overdamping, which may lead to false switching...