2449 search results - page 300 / 490 » VLSI |
100
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VLSID
2005
IEEE
16 years 5 months ago
2005
IEEE
This paper explores the recovery and rate capacity effect for batteries used in embedded systems. It describes the prominent battery models with their advantages and drawbacks. It...
107
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VLSID
2005
IEEE
16 years 5 months ago
2005
IEEE
In this paper, we have studied and compared the RF performance metrics, unity gain frequency (ft) and Noise Figure (NF), of the devices with channel engineering consisting of halo...
113
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VLSID
2005
IEEE
16 years 5 months ago
2005
IEEE
Timing margin (slack) needs to be carefully managed to ensure a satisfactory timing yield. We propose a new design flow that combines a false-path-aware gate sizing and a statisti...
138
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VLSID
2005
IEEE
16 years 5 months ago
2005
IEEE
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
125
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VLSID
2005
IEEE
16 years 5 months ago
2005
IEEE
Low-Density Parity Check codes are a form of Error Correcting Codes used in various wireless communication applications and in disk drives. While LDPC codes are desirable due to t...