2449 search results - page 310 / 490 » VLSI |
146
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ICCD
2008
IEEE
16 years 2 months ago
2008
IEEE
- A gate level probabilistic error propagation model is presented which takes as input the Boolean function of the gate, the signal and error probabilities of the gate inputs, and ...
163
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ICCD
2006
IEEE
16 years 2 months ago
2006
IEEE
This paper proposes a stochastic dynamic thermal management (DTM) technique in high-performance VLSI system with especial attention to the uncertainty in temperature observation. ...
139
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ICCD
2006
IEEE
16 years 2 months ago
2006
IEEE
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...
136
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ICCD
2005
IEEE
16 years 2 months ago
2005
IEEE
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for VLSI design. This paper,...
129
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ICCD
2005
IEEE
16 years 2 months ago
2005
IEEE
In this paper we present algorithmic and architectural methodology for building Particle Filters in hardware. Particle filtering is a new paradigm for filtering in presence of n...