2449 search results - page 312 / 490 » VLSI |
133
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ICCAD
2002
IEEE
16 years 1 months ago
2002
IEEE
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
156
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VLSID
2009
IEEE
15 years 12 months ago
2009
IEEE
Abstract— This paper introduces a fuzzy logic based guidance architecture to a graph grammar framework for automated design of analog circuits. The grammar generates circuit topo...
148
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
—This paper presents a novel VLSI implementation of a MIMO detector for OFDM systems. The proposed architecture is able to perform both linear MMSE and reduced latticeaided MIMO ...
144
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...
115
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DFT
2009
IEEE
15 years 11 months ago
2009
IEEE
The temperature dependence of MOSFET drain current varies with supply voltage. Two distinct voltage regions exist—a normal dependence (ND) region where an increase in temperatur...