2449 search results - page 320 / 490 » VLSI |
136
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ISVLSI
2007
IEEE
15 years 11 months ago
2007
IEEE
Performance, power, and functionality, yield and manufacturability are rapidly becoming additional critical factors that must be considered at higher levels of ion. A possible sol...
124
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ISVLSI
2007
IEEE
15 years 11 months ago
2007
IEEE
Formal verification has become an important step in circuit and system design. A prominent technique is Bounded Model Checking (BMC) which is widely used in industry. In BMC it i...
139
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ISVLSI
2007
IEEE
15 years 11 months ago
2007
IEEE
As CMOS technology continues to scale, copper interconnect (CuI) will hinder the performance and reliability of Field Programmable Gate Arrays (FPGA) motivating the need for alter...
140
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VLSID
2007
IEEE
15 years 11 months ago
2007
IEEE
In this paper we demonstrate the impact of the floorplan on the temperature-dependent leakage power of a System on Chip (SoC). We propose a novel system level temperature aware a...
131
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VLSID
2007
IEEE
15 years 11 months ago
2007
IEEE
In recent years, research and development in the field of machine learning and classification techniques have gained paramount importance. The future generation of intelligent e...