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130
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CODES
2005
IEEE
15 years 10 months ago
2005
IEEE
Sensor network applications face continuously changing environments, which impose varying processing loads on the sensor node. This paper presents an online control method which a...
118
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DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
124
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DFT
2005
IEEE
15 years 10 months ago
2005
IEEE
We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular we focus on the motion estimation process perf...
139
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DFT
2005
IEEE
15 years 10 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
127
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DFT
2005
IEEE
15 years 10 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...