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121
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DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
141
Voted
DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
134
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DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
149
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DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
170
Voted
DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
We discuss the use of convolutional codes to perform concurrent error detection (CED) in finite state machines (FSMs). We examine a previously proposed methodology, we identify i...