2449 search results - page 341 / 490 » VLSI |
145
click to vote
VTS
2002
IEEE
15 years 9 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
138
Voted
DATE
2000
IEEE
15 years 9 months ago
2000
IEEE
As the CMOS technology scaled down, the horizontal coupling capacitance between adjacent wires plays dominant part in wire load, crosstalk interference becomes a serious problem f...
128
click to vote
ICCAD
2000
IEEE
15 years 9 months ago
2000
IEEE
Coupling effects between on-chip interconnects must be addressed in ultra deep submicron VLSI and system-on-a-chip (SoC) designs. A new low-power bus encoding scheme is proposed t...
145
click to vote
ASPDAC
2000
ACM
15 years 9 months ago
2000
ACM
After a detailed analysis and discussion of two important characteristics of today’s battery cells (i.e., their current-capacity and current-voltage curves), this paper descr...
126
click to vote
DAC
2000
ACM
15 years 9 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...