2449 search results - page 373 / 490 » VLSI |
144
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DAC
2002
ACM
16 years 5 months ago
2002
ACM
Reducing power dissipation is one of the most principle subjects in VLSI design today. Scaling causes subthreshold leakage currents to become a large component of total power diss...
148
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DAC
2002
ACM
16 years 5 months ago
2002
ACM
The ability to compute the parasitic inductance of the interconnect is critical to the timing verification of modern VLSI circuits. A challenging aspect of inductance extraction i...
136
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
165
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
160
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
As power consumption of the clock tree in modern VLSI designs tends to dominate, measures must be taken to keep it under control. This paper introduces an approach for reducing cl...