2449 search results - page 378 / 490 » VLSI |
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VLSID
2008
IEEE
16 years 4 months ago
2008
IEEE
Technology scaling has resulted in an exponential increase in the leakage power as well as the variations in leakage power of fabricated chips. Functional units (FUs), like Intege...
133
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VLSID
2008
IEEE
16 years 4 months ago
2008
IEEE
Protocol conversion involves the use of a converter to control communication between two or more protocols such that desired system-level specifications can be satisfied. We invest...
120
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VLSID
2008
IEEE
16 years 4 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
132
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VLSID
2008
IEEE
16 years 4 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
168
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VLSID
2008
IEEE
16 years 4 months ago
2008
IEEE
Today's customizable processors allow the designer to augment the base processor with custom accelerators. By choosing appropriate set of accelerators, designer can significa...