2449 search results - page 386 / 490 » VLSI |
141
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VLSID
2005
IEEE
16 years 4 months ago
2005
IEEE
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
157
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VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
In this paper, we describe NoCGEN, a Network On Chip (NoC) generator, which is used to create a simulatable and synthesizable NoC description. NoCGEN uses a set of modularised rou...
VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
131
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VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
119
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VLSID
2004
IEEE
16 years 4 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...